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Contributions are invited on all aspects of the research, development and applications of the science and technology of measurement and instrumentation. Authors are encouraged to submit novel material which could include results of research or experimental work, may deal with practical developments related to plant or process, discuss new developments in sensors and instrumentation, or relate to systems evaluation and modelling.Topics covered include: General principles of measurement and instrumentation; Sensors and sensor systems: design and evaluation; Data acquisition; Signal transmission; Processing and evaluation; Data output; Systems aspects; Systems modelling and evaluation; Specific applications in measurement and instrumentation; Specific instruments and measurement systems; Design and manufacture of instruments; applications of sensors and instrumentation.Benefits to authorsWe also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our support pages: http://support.elsevier.com

Versita was established in 2001 as Central European Science Journals by Jacek Ciesielski. A graduate of the London School of Economics and the University of Minnesota Carlson School of Management, Ciesielski has worked as a journalist, private entrepreneur, and the general manager of local subsidiaries of global corporations Hasbro and Fuji Photo Film.

Subject coverageWith 12 issues per year, Measurement Science and Technology publishes articles on new measurement techniques and associated instrumentation. Papers submitted to MST that describe experiments must represent an advance in measurement science or measurement technique rather than the application of established experimental technique. Authors must make this novel aspect clear, bearing in mind the multidisciplinary readership of the journal. Subject coverage includes the theory, practice and application of measurement in physics, chemistry, engineering and the environmental and life sciences from inception to commercial exploitation.Publications in the journal should emphasise the novelty of reported methods and give possible applications.

Measurement Techniques contains articles of interest to all who are engaged in the study and application of fundamental measurements.Coverage includes: general problems of metrology; Uniformity of measurement results; Measurement standards and methods; New techniques in measurement: linear, mechanical, electromagnetic, optical, time and frequency, thermo-technical, ionising radiations and more. The journal Measurement Techniques is a translation of the peer reviewed Russian journals: Izmeritel'naya Tekhnika and selected articles from Metrologiya. Both original Russian journals are publications of Gosstandart of Russia, the All-Russia Scientific-Research Institute for Optical-Physical Measurements, the Metrological Academy of Russia, the D.I.Mendeleev All-Russia Scientific-Research Instritute of Metrology, the All-Russia Scientific-Research Institute for Physical-Technical and Radiotechnical Measurements and the Ural Scientific-Research Institute of Metrology.

tm ist die Fachzeitschrift für anwendungsbezogene industrielle Messtechnik, als eine der wesentlichen Komponenten für Automatisierung, Prozess- überwachung, Qualitätskontrolle und Sicherheitstechnik. tm dient dem Informations- und Erfahrungsaustausch zwischen den Entwicklern anwendungsreifer Sensoren, Messsysteme und Messverfahren und den Herstellern und Messtechnikern in der Anwendung.

The Institute’s Journal, Measurement + Control, publishes practical technical articles from industry and academia, product and business news and information on technical advances. We welcome and encourage submission of papers and articles on relevant subjects. Please see the authors’ notes for further information and advice on style and content.

Mechanics of Materials is a forum for original scientific research on the flow, fracture, and general constitutive behavior of geophysical, geotechnical and technological materials, with balanced coverage of advanced technological and natural materials, with balanced coverage of theoretical, experimental, and field investigations. Of special concern are macroscopic predictions based on microscopic models, identification of microscopic structures from limited overall macroscopic data, experimental and field results that lead to fundamental understanding of the behavior of materials, and coordinated experimental and analytical investigations that culminate in theories with predictive quality.Original contributions are published on the thermomechanical behavior of technological materials such as metals, polymers, ceramics, various advanced composites, wood, etc., geotechnical materials such as rock and soil, and on thermomechanical processes pertaining to solid earth geophysics. The journal contains research papers, invited review articles, brief notes, letters to the editor, book reviews and news items.Benefits to authorsWe also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our support pages: http://support.elsevier.com

Microscopy Research and Technique ( MRT ) publishes articles on all aspects of advanced microscopy in the biological, clinical, chemical, and materials sciences. Original research as well as technical papers dealing with the various subsets of microscopy are welcomed. This includes electron microscopy (transmission electron microscopy, scanning electron microscopy, analytical microscopy [X-ray, EELS, Auger, etc.]), light microscopy (confocal microscopy, video microscopy, fluorescence microscopy, light microscopy combined Raman spectroscopy, fourier transform infra red spectroscopy [FTIR], etc.), scanning probe microscopy (AFM, STM, etc.), micro magnetic resonance imaging, micro acoustic imaging, as well as image analysis, quantitative morphology, and all other forms of leading edge microscopic imaging and image analysis. It is expected that manuscripts submitted for consideration will clearly present the scientific question, justify the type of specimen(s) used in the experiment, explicitly describe the methods utilized, employ proper statistics, present previously unpublished data, discuss whether the experiment has answered the proposed question, compare the results with those in salient published literature, and conform to MRT 's prescribed journal format.

New Astronomy publishes articles in all fields of astronomy and astrophysics, with a particular focus on computational astronomy: mathematical and astronomy techniques and methodology, simulations, modelling and numerical results and computational techniques in instrumentation.New Astronomy includes full length research articles and letter articles. The journal covers solar, stellar, galactic and extragalactic astronomy and astrophysics. It reports on original research in all wavelength bands, ranging from radio to gamma-ray.Benefits to authorsWe also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our support pages: http://support.elsevier.com

Section A of Nuclear Instruments and Methods in Physics Research publishes papers on design, manufacturing and performance of scientific instruments with an emphasis on large scale facilities. This includes the development of particle accelerators, ion sources, beam transport systems and target arrangements as well as the use of secondary phenomena such as synchrotron radiation and free electron lasers. It also includes all types of instrumentation for the detection and spectrometry of radiations from high energy processes and nuclear decays, as well as instrumentation for experiments at nuclear reactors. Specialized electronics for nuclear and other types of spectrometry as well as computerization of measurements and control systems in this area also find their place in the A section.Theoretical as well as experimental papers are accepted.Sponsored issues publication:The journal Nuclear Instruments and Methods in Physics Research offers interested parties the option of fast publication in (supplemental) sponsored issues. For more information please click here.Benefits to authorsWe also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our support pages: http://support.elsevier.com

Section B of Nuclear Instruments and Methods in Physics Research covers all aspects of the interaction of energetic beams with atoms, molecules and aggregate forms of matter. This includes ion beam analysis and ion beam modification of materials as well as basic data of importance for these studies. Topics of general interest include: atomic collisions in solids, particle channelling, all aspects of collision cascades, the modification of materials by energetic beams, ion implantation, irradiation - induced changes in materials, the physics and chemistry of beam interactions and the analysis of materials by all forms of energetic radiation. Modification by ion, laser and electron beams for the study of electronic materials, metals, ceramics, insulators, polymers and other important and new materials systems are included. Related studies, such as the application of ion beam analysis to biological, archaeological and geological samples as well as applications to solve problems in planetary science are also welcome. Energetic beams of interest include atomic and molecular ions, neutrons, positrons and muons, plasmas directed at surfaces, electron and photon beams, including laser treated surfaces and studies of solids by photon radiation from rotating anodes, synchrotrons, etc. In addition, the interaction between various forms of radiation and radiation-induced deposition processes are relevant.Benefits to authorsWe also provide many author benefits, such as free PDFs, a liberal copyright policy, special discounts on Elsevier publications and much more. Please click here for more information on our author services.Please see our Guide for Authors for information on article submission. If you require any further information or help, please visit our support pages: http://support.elsevier.com

The project on independent on-line library of Blackhorse Scientific Publishers has been intorduced as early as in 1999 when Blackhorse became an independent publishing house. During previous Springer time, several efforts was made to create the up-to-date scalable and relayable database. However, on that time no such similar on-line library existed in Poland. So, the new venture to offer the full text database containing all manuscripts published at Blackhorse\'s journals started in June 1999. Just amonths thereafter, Blackhorse became a registrant of The Digital Object Identifier Foundadtion, Inc. (Washington, DC) and started to collect the manuscripts accordant to the DOI standards. The special numbering system providing and assuring the full control over several manuscripts and unifing them was developed and introduced into the standarized company's workflow.

The scope of Optoelectronics, Instrumentation and Data Processing encompasses, but is not restricted to, the following areas: analysis and synthesis of signals and images: artificial intelligence methods: automated measurement systems: physicotechnical foundations of micro- and optoelectronics: optical information technologies: systems and components: modelling in physicotechnical research: laser physics applications: computer networks and data transmission systems. The journal publishes original papers, reviews, and short communications in order to provide the widest possible coverage of latest research and development in its chosen field.